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Polymer-based semiconductors and organic electronics encapsulate a significant research thrust for informatics-driven materials development. However, device measurements are described by a complex array of design and parameter choices, many of which are sparsely reported. For example, the mobility of a polymer-based organic field-effect transistor (OFET) may vary by several orders of magnitude for a given polymer as a plethora of parameters related to solution processing, interface design/surface treatment, thin-film deposition, postprocessing, and measurement settings have a profound effect on the value of the final measurement. Incomplete contextual, experimental details hamper the availability of reusable data applicable for data-driven optimization, modeling (e.g., machine learning), and analysis of new organic devices. To curate organic device databases that contain reproducible and findable, accessible, interoperable, and reusable (FAIR) experimental data records, data ontologies that fully describe sample provenance and process history are required. However, standards for generating such process ontologies are not widely adopted for experimental materials domains. In this work, we design and implement an object−relational database for storing experimental records of OFETs. A data structure is generated by drawing on an international standard for batch process control (ISA-88) to facilitate the design. We then mobilize these representative data records, curated from the literature and laboratory experiments, to enable data-driven learning of process−structure−property relationships. The work presented herein opens the door for the broader adoption of data management practices and design standards for both the organic electronics and the wider materials community.